{"id":848,"date":"2021-09-27T10:07:52","date_gmt":"2021-09-27T10:07:52","guid":{"rendered":"https:\/\/science.utm.my\/physics\/?page_id=848"},"modified":"2021-09-27T15:44:48","modified_gmt":"2021-09-27T15:44:48","slug":"scanning-probe-microscope-spm","status":"publish","type":"page","link":"https:\/\/science.utm.my\/physics\/scanning-probe-microscope-spm\/","title":{"rendered":"SCANNING PROBE MICROSCOPE (SPM)"},"content":{"rendered":"<p><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter wp-image-850 size-large\" src=\"http:\/\/science.utm.my\/physics\/wp-content\/uploads\/sites\/593\/2021\/09\/Scanning-Probe-Microscope.jpg\" alt=\"\" width=\"1024\" height=\"576\" \/><\/p>\n<p><b>Brand-Model<br \/>\n<\/b><span style=\"font-weight: 400;\">SPA300HV, SII NanoTechnology Inc.<\/span><\/p>\n<p><b>Descriptions<br \/>\n<\/b><span style=\"font-weight: 400;\">A microscope that perform material analysis and surface topography observation of microscopic areas. The example of SPM mode are STM (Scanning Tunnel Microscope), AFM (Atomic Force Microscope), DFM (Dynamic Force Mode\/Microscope), KFM (Kelvin Probe Force Microscope) and more.<\/span><\/p>\n<p><b>Specifications<br \/>\n<\/b><span style=\"font-weight: 400;\">Probe station controller: Z Axis Servo Controller<br \/>\n<\/span><span style=\"font-weight: 400;\">Displacement Signal: Displacement of band signal (for AFM), displacement of amplitude signal (for DFM) and changes in the tunnel current (for STM)<br \/>\n<\/span><span style=\"font-weight: 400;\">Temperature control: heating to 800\u00b0C (max)<br \/>\n<\/span><span style=\"font-weight: 400;\">Scanner: XY Raster Scanner, 3-D image can be generated using the Z data corresponding to the XY coordinate data<\/span><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Brand-Model SPA300HV, SII NanoTechnology Inc. Descriptions A microscope that perform material analysis and surface topography observation of microscopic areas. The example of SPM mode are STM (Scanning Tunnel Microscope), AFM (Atomic Force Microscope), DFM (Dynamic Force Mode\/Microscope), KFM (Kelvin Probe Force Microscope) and more. Specifications Probe station controller: Z Axis Servo Controller Displacement Signal: Displacement [&hellip;]<\/p>\n","protected":false},"author":273,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","footnotes":""},"class_list":["post-848","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/science.utm.my\/physics\/wp-json\/wp\/v2\/pages\/848","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/science.utm.my\/physics\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/science.utm.my\/physics\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/science.utm.my\/physics\/wp-json\/wp\/v2\/users\/273"}],"replies":[{"embeddable":true,"href":"https:\/\/science.utm.my\/physics\/wp-json\/wp\/v2\/comments?post=848"}],"version-history":[{"count":4,"href":"https:\/\/science.utm.my\/physics\/wp-json\/wp\/v2\/pages\/848\/revisions"}],"predecessor-version":[{"id":956,"href":"https:\/\/science.utm.my\/physics\/wp-json\/wp\/v2\/pages\/848\/revisions\/956"}],"wp:attachment":[{"href":"https:\/\/science.utm.my\/physics\/wp-json\/wp\/v2\/media?parent=848"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}