SCANNING PROBE MICROSCOPE (SPM)

Brand-Model
SPA300HV, SII NanoTechnology Inc.

Descriptions
A microscope that perform material analysis and surface topography observation of microscopic areas. The example of SPM mode are STM (Scanning Tunnel Microscope), AFM (Atomic Force Microscope), DFM (Dynamic Force Mode/Microscope), KFM (Kelvin Probe Force Microscope) and more.

Specifications
Probe station controller: Z Axis Servo Controller
Displacement Signal: Displacement of band signal (for AFM), displacement of amplitude signal (for DFM) and changes in the tunnel current (for STM)
Temperature control: heating to 800°C (max)
Scanner: XY Raster Scanner, 3-D image can be generated using the Z data corresponding to the XY coordinate data